Planar edgeless silicon detectors for the TOTEM experiment

IEEE Transactions on Nuclear Science

Volumn 52, Issue 5 III, 2005, Pages 1899-1902

  Ruggiero, G ^a   Alagoz, E ^a   Avati, V ^b   Bassetti, V ^c   Berardi, V ^d   Bergholm, V ^b   Boccone, V ^c   Bozzo, M ^c   Buzzo, A ^c   Catanesi, M G ^d   Cereseto, R ^c   Cuneo, S ^c   Deile, M ^a   De Oliveira, R ^a   Eggert, K ^a   Egorov, N ^e   Eremin, I ^f   Ferro, F ^c   Hasi, J ^g   Haug, F ^a   Herzog, R ^h   Jarron, P ^a   Kalliopuska, J ^b   Kiiskinen, A ^b   Kurvinen, K ^b   Kok, A ^g   Kundrat W ⁱ   Lauhakangas, R ^b   Lokajiccek M ⁱ   Macina, D ^a   Macri M ^c   Maki T ^b   Minutoli, S ^c   Mirabito, L ^j   Morelli, A ^c   Musico, P ^c   Negri, M ^c   Niewiadomski, H ^a   Noschis, E ^a   Oljemark, F ^b   Orava, R ^b   Oriunno, M ^a   Osterberg K ^b   Palmieri, V G ^b   Puppo, R ^c   Radicioni, E ^d   Rudischer, R ^h   Saarikko, H ^b   Sanguinetti, G ^k   Santroni, A ^c   Siegrist, P ^a   Sidorov, A ^e   Sette, G ^c   Smotlacha, J ⁱ   Snoeys, W ^a   Tapprogge, S ^b   Toppinen, A ^b   Verdier, A ^a   Watts, S ^g   Wobst, E ^h   more..

^a CERN   (Switzerland)

^b UNIVERSITY OF HELSINKI   (Finland)

^c UNIVERSITY OF GENOA   (Italy)

^d POLITECNICO DI BARI   (Italy)

^e Research Institute of Material Science and Technology   (Russian Federation)

^f IOFFE INSTITUTE   (Russian Federation)

^g BRUNEL UNIVERSITY   (United Kingdom)

^h Institut fur Luft Und Kaltetechnik   (Germany)

ⁱ INSTITUTE OF PHYSICS   (Czech Republic)

^j Institute de Physique Nucleaire de Lyon ^*  (France)

^k INFN SEZIONE DI PISA   (Italy)

more..

Author keywords

Microstrip; Silicon radiation detectors

Indexed keywords

ELECTRIC VARIABLES MEASUREMENT; MICROSTRIP DEVICES; SILICON;

ELECTRICAL STABILITY; SILICON RADIATION DETECTORS;

RADIATION DETECTORS;

EID: 29144473394     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2005.856910     Document Type: Article

References (7)

1. TOTEM TDR, CERN-LHCC-2004-002, TOTEM-TDR-001, Jan. 7, 2004.
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