Analysis of pine pollen by using FTIR, SEM and energy-dispersive X-ray analysis

Guang Pu Xue Yu Guang Pu Fen Xi/Spectroscopy and Spectral Analysis

Volumn 25, Issue 11, 2005, Pages 1797-1800

  Wang, Ya Min ^a   Wang, Hong Jie ^a   Zhang, Zhuo Yong ^a  

^a CAPITAL NORMAL UNIVERSITY   (China)

Author keywords

Energy dispersive X ray analysis; Infrared spectroscopy; Pine pollen; Scanning electron microscope

Indexed keywords

ARTICLE; CHEMISTRY; INFRARED SPECTROSCOPY; METHODOLOGY; PINE; POLLEN; SCANNING ELECTRON MICROSCOPY; SPECTROMETRY; ULTRASTRUCTURE;

MICROSCOPY, ELECTRON, SCANNING; PINUS; POLLEN; SPECTROMETRY, X-RAY EMISSION; SPECTROSCOPY, FOURIER TRANSFORM INFRARED;

EID: 29144469144     PISSN: 10000593     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (15)