Characterization, test, and logic synthesis of and-or-inverter (AOI) gate design for QCA implementation

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 24, Issue 12, 2005, Pages 1881-1892

  Momenzadeh, Mariam ^a,b   Huang, Jing ^a,b,c   Tahoori, Mehdi B ^a,b,c   Lombardi, Fabrizio ^a,b  

^a IEEE   (United States)

^b Northeastern University   (United States)

^c NORTHEASTERN UNIVERSITY   (United States)

Author keywords

AOI; Defect analysis; Device characterization; Emerging technologies; QCA; Testing

Indexed keywords

AOI; DEFECT ANALYSIS; DEVICE CHARACTERIZATION; EMERGING TECHNOLOGIES; QCA;

DATA ACQUISITION; DEFECTS; GATES (TRANSISTOR); LOGIC DEVICES; NANOTECHNOLOGY; PRODUCT DESIGN; TESTING;

ELECTRIC INVERTERS;

EID: 29144434473     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2005.852667     Document Type: Conference Paper

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