In situ transmission electron microscopy studies of electric-field-induced phenomena in ferroelectrics

Journal of Materials Research

Volumn 20, Issue 7, 2005, Pages 1641-1653

  Tan, Xiaoli ^a   He, Hui ^a   Shang, Jian Ku ^b  

^a Iowa State University of Science and Technology   (United States)

^b University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; GRAIN BOUNDARIES; LEAD COMPOUNDS; PHASE TRANSITIONS; PIEZOELECTRICITY; POLARIZATION; POLYCRYSTALLINE MATERIALS; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRIC FIELD INDUCED PHENOMENA; FERROELECTRIC SINGLE CRYSTAL; PIEZOLECTRIC STRAINS; POLARIZATION SWITCHING;

FERROELECTRIC CERAMICS;

EID: 29044448333     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2005.0213     Document Type: Article

References (41)

1. I.A. Blech and E.S. Meieran: Direct transmission electron microscope observation of electrotransport in aluminum thin films. Appl. Phys. Lett. 11, 263 (1967).
2. L. Berenbaum: Electromigration damage of grain-boundary triple points in Al thin films. J. Appl. Phys. 42, 880 (1971).
3. H. Okabayashi, M. Komatsu, and H. Mori: Depth-resolved in-situ TEM observation of electromigration in a submicron-wide layered Al-0.5% Cu line. Jpn. J. Appl. Phys. Part 1 35, 1102 (1996).
4. H. Okabayashi, H. Kitamura, M. Komatsu, and H. Mori: Behavior of electromigration-induced gaps in a layered Al line observed by in situ sideview transmission electron microscopy. Appl. Phys. Lett. 68, 1066 (1996).
5. H. Mori, H. Okabayashi, and M. Komatsu: Electromigration in layered Al lines studied by in-situ ultra-high voltage electron microscopy. Thin Solid Films 300, 25 (1997).
6. 3. Phys. Status Solidi A 62, 657 (1980).
7. E. Snoeck, L. Normand, A. Thorel, and C. Roucau: Electron microscopy study of ferroelastic and ferroelectric domain-wall motions induced by the in situ application of an electric field in BaTiOs. Phase Trans. 46, 77 (1994).
8. V. Saikumar, H.M. Chan, and M.P. Hamer: Investigation of ferroelectrics using conventional and in situ electron microscopy, in Proc. 52nd Annual Meeting of Microscopy Society of America, edited by G.W. Bailey and A.J. Garratt-Reed (San Francisco Press, San Francisco, CA, 1994), pp. 586-587.
9. X. Lin, C. Murray, and V.P. Dravid: Statics and dynamics of charged interfaces in electroceramics, in Microscopy and Microanalysis 1998, edited by G.W. Bailey, K.B. Alexander, W.G. Jerome, M.G. Bond, and J.J. McCarthy. (Springer, New York, 1998), pp. 552-553.
10. A. Krishnan, M.E. Bisher, and M.M.J. Treacy: In situ TEM study of domain propagation in ferroelectric barium titanate and its role in fatigue, in Ferroelectric Thin Films VII, edited by R.E. Jones, R.W. Schwartz, S.R. Summerfelt, and I.K. Yoo (Mater. Res. Soc. Symp. Proc. 541, Warrendale, PA, 1999), p. 475.
11. C.A. Randall, D.J. Barber, and R.W. Whatmore: In situ TEM experiments on perovskite-structured ferroelectric relaxor materials. J. Microsc. 145, 275 (1987).
12. Z.L. Wang and Z.C. Kang: Functional and Smart Materials: Structural Evolution and Structure Analysis (Plenum Press, New York, 1998), p. 396.
13. K.D. Johnson and V.P. Dravid: Grain boundary barrier breakdown in niobium donor doped strontium titanate using in situ electron holography. Appl. Phys. Lett. 74, 621 (1999).
14. X. Tan, T. Du, and J.K. Shang: Piezoelectric-actuated in situ transmission electron-microscopy technique for fatigue failure study on constrained metal thin films. Appl. Phys. Lett. 80, 3946 (2002).
15. X. Tan and J.K. Shang: In-situ TEM observations of electric field induced domain switching and microcracking in ferroelectric ceramics. Mater. Sci. Eng. A314, 157 (2001).
16. 3. Appl. Phys. Lett. 76, 3732 (2000).
17. 3 single crystal. Appl. Phys. Lett. 77, 1529 (2000).
18. X. Tan and J.K. Shang: In-situ transmission-electron-microscopy study of electric field-induced grain boundary cracking in lead zirconate titanate. Philos. Mag. A 82, 1463 (2002).
19. H. He and X. Tan: In situ transmission-electron-microscopy study of the electric field-induced transformation of incommensurate modulations in a Sn-modified lead zirconate titanate ceramic. Appl. Phys. Lett. 85, 3187 (2004).
20. M.E. Lines and A.M. Glass: Principles and Applications of Ferroelectrics and Related Materials (Clarendon Press, Oxford, U.K., 1977).
21. W. Pan, Q. Zhang, A. Bhalla, and L.E. Cross: Field-forced antiferroelectric-to-ferroelectric switching in modified lead zirconate titanate stannate ceramics. J. Am. Ceram. Soc. 72, 571 (1989).
22. 3. J. Appl. Phys. 71, 1361 (1992).
23. S.E. Park and T.R. Shrout: Ultrahigh strain and piezoelectric behavior in relaxor based ferroelectric single crystals. J. Appl. Phys. 82, 1804 (1997).
24. S. Wada, S. Suzuki, T. Noma, T. Suzuki, M. Osada, M. Kakihana, S.E. Park, L.E. Cross, and T.R. Shrout: Enhanced piezoelectric property of barium titanate single crystals with engineered domain configurations. Jpn. J. Appl. Phys. 38, 5505 (1999).
25. Z.G. Ye: Relaxor ferroelectric complex perovskites: Structure, properties, and phase transitions. Key Eng. Mater. 155-156, 81 (1998).
26. H. Cao and A.G. Evans: Electric-field-induced fatigue crack growth in piezoelectrics. J. Am. Ceram. Soc. 77, 1783 (1994).
27. J.K. Shang and X. Tan: A maximum strain criterion for electric-field-induced fatigue-crack propagation in ferroelectric ceramics. Mater. Sci. Eng. A301, 131 (2001).
28. G.S. White, A.S. Raynes, M.D. Vaudin, and S.W. Freiman: Fracture behavior of cyclically loaded PZT. J. Am. Ceram. Soc. 77, 2603 (1994).
29. C.S. Lynch, W. Yang, L. Collier, Z. Suo, and R.M. McMeeking: Electric field induced cracking in ferroelectric ceramics. Ferroelectrics 166, 11 (1995).
30. R.M. McMeeking: Electrostrictive stresses near crack-like flaw. J. Appl. Math. Phys. 40, 615 (1989). ZAMP.
31. Z. Suo: Mechanics concepts for failure in ferroelectric ceramics, in Smart Structures and Materials, edited by G.K. Haritos and A.V. Srinivasan (ASME, New York, 1991), AD Vol. 24/AMD Vol. 123, p. 1.
32. E.K. Beauchamp: Effect of microstructure on pulse electric strength of MgO. J. Am. Ceram. Soc. 54, 484 (1971).
33. H.C. Ling and D.D. Chang: In situ observation of electrode melting in multilayer ceramic capacitors. J. Mater. Sci. 24, 4128 (1989).
34. 3 relaxor dielectric ceramic: Part II, life performance. J. Am. Ceram. Soc. 76, 459 (1993).
35. C.K. Campbell, J.D. van Wyk, and R. Chen: Experimental and theoretical characterization of an antiferroelectric ceramic capacitor for power electronics. IEEE Trans. Comp. Pack. Technol. 25, 211 (2002).
36. Y. Chang, J. Lian, and Y. Wang: One-dimensional regular arrays of antiphase domain boundaries in antiferroelectric tin-substituted lead zirconate titanate ceramics. Appl. Phys. A 36, 221 (1985).
37. J.S. Speck, M. De Graef, A.P. Wilkinson, A.K. Cheetham, and D.R. Clarke: Hierarchical domain structures and in situ domain migration in the antiferroelectric ceramic PLSnZT. J. Appl. Phys. 73, 7261 (1993).
38. Z. Xu, D. Viehland, and D.A. Payne: An incommensurate-commensurate phase transformation in antiferroelectric tin-modified lead zirconate titanate. J. Mater. Res. 10, 453 (1995).
39. D. Viehland, X.H. Dai, J.F. Li, and Z. Xu: Effects of quenched disorder on La-modified lead zirconate titanate: Long- and short-range ordered structurally incommensurate phases, and glassy polar clusters. J. Appl. Phys. 84, 458 (1998).
40. 3. J. Mater. Res. 18, 262 (2003).
41. D. Viehland, Z. Xu, and D.A. Payne: Origin of F spots and stress sensitivity in lanthanum lead zirconate titanate. J. Appl. Phys. 74, 7454 (1993).