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Journal of Analytical Atomic Spectrometry

Volumn 20, Issue 12, 2005, Pages 1398-1424

Atomic spectrometry update. Industrial analysis: Metals, chemicals and advanced materials

(4) Fisher, Andy S a Goodall, Phill S b Hinds, Michael W c Penny, Denise M d

a UNIVERSITY OF PLYMOUTH (United Kingdom)

b SELLAFIELD LTD (United Kingdom)

c Royal Canadian Mint (Canada)

d SHELL RESEARCH AND TECHNOLOGY CENTRE (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; DATA REDUCTION; INDUSTRIAL APPLICATIONS; LASER ABLATION; X RAY ANALYSIS;

INDUSTRIAL ANALYSIS; SPECIATION ANALYSIS; SPECTROMETRIC DATA;

ATOMIC SPECTROSCOPY;

EID: 29044448146 PISSN: 02679477 EISSN: 13645544 Source Type: Journal
DOI: 10.1039/b514779b Document Type: Review

Times cited : (15)

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