Measuring the angular dependent energy distribution of backscattered electrons at variable geometry

Scanning

Volumn 27, Issue 6, 2005, Pages 298-304

  Wagner, Julian ^a,c   Stummer, W ^b   Volkerer M ^b   Hanke, A ^b   Wernisch, J ^b  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^b VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^c Center for Electron Microscopy   (Austria)

Author keywords

Backscattered electrons; Depth distribution function; Double differential angular and energy distribution; Electron probe microanalysis; Phiroz

Indexed keywords

AMPLIFIERS (ELECTRONIC); ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTRON BEAMS; ELECTRONS; ENERGY ABSORPTION;

BACKSCATTERED ELECTRONS; DEPTH DISTRIBUTION FUNCTIOM; DOUBLE DISTRIBUTION; ELECTRON PROBE MICROANALYSIS; PHIROZ;

BACKSCATTERING;

APPARATUS; ARTICLE; CALCULATION; CALIBRATION; ELECTRIC POTENTIAL; ELECTRON BEAM; ELECTRON MICROSCOPE; ELECTRON MICROSCOPY; ENERGY; GEOMETRY; IONIZATION; MATHEMATICAL ANALYSIS; PRIORITY JOURNAL; RADIATION SCATTERING; ROTATION; SIGNAL DETECTION;

AMPLIFIERS; ELECTRIC CURRENT; ELECTRON BEAMS; ELECTRONS;

EID: 29044446691     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.4950270605     Document Type: Article

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