Defect based micromechanical modelling and simulation of nanoSPD CP-Ti in post-deformation

Materials Science and Engineering: A

Volumn 410-411, Issue , 2005, Pages 217-221

  Zeipper, L F ^a,b,c   Zehetbauer, Michael J ^b   Holzleithner, Ch ^b  

^a ARC SEIBERSDORF RESEARCH GMBH   (Austria)

^b UNIVERSITY OF VIENNA   (Austria)

^c Georg Fischer Automobilguss AG   (Austria)

Author keywords

Cell size; Constitutive modelling; Deformation induced vacancies; Dislocation density; NanoSPD titanium post deformation; Severe plastic deformation

Indexed keywords

COMPUTER SIMULATION; CRYSTAL DEFECTS; CRYSTAL LATTICES; CRYSTAL MICROSTRUCTURE; ELECTRIC CONDUCTIVITY MEASUREMENT; MATHEMATICAL MODELS; PLASTIC DEFORMATION; STRAIN HARDENING; THERMAL EFFECTS; VOLUME FRACTION;

CELL SIZE; CONSTITUTIVE MODELLING; DEFORMATION INDUCED VACANCIES; DISLOCATION DENSITY; RESIDUAL ELECTRICAL RESISTIVITY; SEVERE PLASTIC DEFORMATION; ZEHETBAUER MODEL;

TITANIUM METALLOGRAPHY;

DEFORMATION;

EID: 28944454564     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msea.2005.08.120     Document Type: Article

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