SCOPUS 정보 검색 플랫폼

Volumn 5857, Issue , 2005, Pages 1-8

Interferometric fringes projection system for 3D profilometry and relief investigation

Author keywords

3D measurement; Archeometry; Profilometry; Structured light

Indexed keywords

INTERFEROMETRY; LASERS; OPTICAL PROJECTORS; POLARIZATION; PROFILOMETRY; SIGNAL INTERFERENCE;

3D MEASUREMENT; ARCHEOMETRY; EPIGRAPHIC INVESTIGATIONS; STRUCTURED LIGHT;

PROJECTION SYSTEMS;

EID: 28844492168 PISSN: 0277786X EISSN: None Source Type: Conference Proceeding
DOI: 10.1117/12.612949 Document Type: Conference Paper

Times cited : (10)

References (10)

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2
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5
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- Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry
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6
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- Spatial carrier-fringe pattern analysis by means of wavelet transform: Wavelet transform profilometry
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7
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- Generalized frequency selection in multifrequency interferometry
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8
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- Real-time vibration measurement by spatial phase-shifting technique with a tilted holographic interferogram
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9
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- Fourier-transform method of phase-shift determination
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10
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- Analysis of the conoscopic measurement for uniaxial liquid-crystal tilt angle
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- Van Horn, B.L.¹ Winter, H.H.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.