Topographic voltage and coherence mapping of brain potentials by means of the symbolic resonance analysis

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 72, Issue 5, 2005, Pages

  Graben, Peter Beim ^a   Frisch, Stefan ^a,b,c   Fink, Andrew ^a   Saddy, Douglas ^a   Kurths, Jürgen ^a  

^a UNIVERSITY OF POTSDAM   (Germany)

^b UNIVERSITY OF LEIPZIG   (Germany)

^c MAX PLANCK INSTITUTE FOR HUMAN COGNITIVE AND BRAIN SCIENCES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BRAIN; COHERENT LIGHT; ELECTRIC POTENTIAL; RESONANCE; SIGNAL TO NOISE RATIO; SURFACE TOPOGRAPHY;

EVENT-RELATED BRAIN POTENTIALS (ERPS); INHERENT NOISE; RESONANCE ANALYSIS; TOPOGRAPHIC BRAIN MAPS;

BIOELECTRIC POTENTIALS;

EID: 28844490588     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.72.051916     Document Type: Article

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