Fast three-dimensional phase-unwrapping algorithm based on sorting by reliability following a non-continuous path

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5856 PART I, Issue , 2005, Pages 32-40

  Abdul Rahman, Hussein ^a   Gdeisat, Munther ^a   Burton, David ^a   Lalor, Michael ^a  

^a LIVERPOOL JOHN MOORES UNIVERSITY   (United Kingdom)

Author keywords

Fringe pattern analysis; Phase unwrapping

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; RELIABILITY; VOLUMETRIC ANALYSIS;

FRINGE PATTERN ANALYSIS; PHASE UNWRAPPING; QUALITY MAP; VOXELS;

PATTERN RECOGNITION;

EID: 28844476767     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.611415     Document Type: Conference Paper

References (8)

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