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Volumn 72, Issue 3, 2005, Pages

Young-type interference pattern in molecular inner-shell excitations by electron impact

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON IMPACT; GENERALIZED OSCILLATOR STRENGTH (GOS); YOUNG-TYPE INTERFERENCE PATTERN;

EID: 28844470746     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.72.032711     Document Type: Article
Times cited : (6)

References (28)
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  • 25
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    • Inokuti, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.