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Volumn 383, Issue 7-8, 2005, Pages 1075-1081
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Method for precisely analyzing the stoichiometry of NaxCoO 2-type superconductor material
a
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IFW DRESDEN
(Germany)
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Author keywords
Easily ionized element; ICP OES; Internal standard; Precision; Superconductor; Titration
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Indexed keywords
COBALT;
EMISSION SPECTROSCOPY;
INDUCTIVELY COUPLED PLASMA;
IONIZATION;
SODIUM;
SODIUM COMPOUNDS;
STOICHIOMETRY;
TITRATION;
EASILY IONIZED ELEMENTS;
ICP-OES;
INTERNAL STANDARDS;
PRECISION;
SUPERCONDUCTING MATERIALS;
CERIUM;
CERIUM SULFATE;
COBALT;
COBALT OXIDE;
LITHIUM CHLORIDE;
OXALIC ACID DERIVATIVE;
OXIDE;
SODIUM;
SULFATE;
ARTICLE;
CALIBRATION;
CHEMISTRY;
ELECTRIC CONDUCTIVITY;
OXIDATION REDUCTION REACTION;
REPRODUCIBILITY;
SENSITIVITY AND SPECIFICITY;
STANDARD;
CALIBRATION;
CERIUM;
COBALT;
ELECTRIC CONDUCTIVITY;
LITHIUM CHLORIDE;
OXALATES;
OXIDATION-REDUCTION;
OXIDES;
REFERENCE STANDARDS;
REPRODUCIBILITY OF RESULTS;
SENSITIVITY AND SPECIFICITY;
SODIUM;
SULFATES;
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EID: 28844441997
PISSN: 16182642
EISSN: 16182650
Source Type: Journal
DOI: 10.1007/s00216-005-0041-6 Document Type: Article |
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Times cited : (2)
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References (10)
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