Diffraction of a Bose-Einstein condensate from a magnetic lattice on a microchip

Physical Review Letters

Volumn 95, Issue 17, 2005, Pages

  Gunther A ^a   Kraft, S ^a   Kemmler, M ^a   Koelle, D ^a   Kleiner, R ^a   Zimmermann, C ^a   Fortagh J ^a  

^a UNIVERSITY OF TÜBINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FLIGHT IMAGING; INTEGRATED ATOM; PHASE IMPRINTING; SILICON SUBSTRATE;

ATOMS; ELECTROMAGNETIC WAVE DIFFRACTION; IMAGING TECHNIQUES; MAGNETIC MATERIALS; MICROPROCESSOR CHIPS; SILICON;

ELEMENTARY PARTICLES;

EID: 28844432114     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.95.170405     Document Type: Article

References (18)

1. R. Folman, P. KrÃger, J. Schmiedmayer, J. Denschlag, and C. Henkel, Adv. At. Mol. Opt. Phys. 48, 263 (2002). AAMPE9 1049-250X
2. H. Ott, J. FortÃgh, G. Schlotterbeck, A. Grossmann, and C. Zimmermann, Phys. Rev. Lett. 87, 230401 (2001). PRLTAO 0031-9007 10.1103/PhysRevLett.87.230401
3. W. HÃnsel, P. Hommelhoff, T. HÃnsch, and J. Reichel, Nature (London) NATUAS 0028-0836 413, 498 (2001). 10.1038/35097032
4. Y. Wang, D.Z. Anderson, V.M. Bright, E.A. Cornell, Q. Diot, T. Kishimoto, M. Prentiss, R.A. Saravanan, S.R. Segal, and S. Wu, Phys. Rev. Lett. 94, 090405 (2005). PRLTAO 0031-9007 10.1103/PhysRevLett.94.090405
5. C. Henkel and M. Wilkens, Europhys. Lett. 47, 414 (1999). EULEEJ 0295-5075 10.1209/epl/i1999-00404-8
6. M.P.A. Jones, C.J. Vale, D. Sahagun, B.V. Hall, C.C. Eberlein, B.E. Sauer, K. Furusawa, D. Richardson, and E.A. Hinds, J. Phys. B JPAPEH 0953-4075 37, L15 (2004). 10.1088/0953-4075/37/2/L01
7. Y. Lin, I. Teper, C. Chin, and V. Vuletić, Phys. Rev. Lett. 92, 050404 (2004). PRLTAO 0031-9007 10.1103/PhysRevLett.92.050404
8. J. EstÃve, C. Aussibal, T. Schumm, C. Figl, D. Mailly, I. Bouchoule, C.I. Westbrook, and A. Aspect, Phys. Rev. A 70, 043629 (2004). PLRAAN 1050-2947 10.1103/PhysRevA.70.043629
9. M.R. Matthews, B.P. Anderson, P.C. Haljan, D.S. Hall, C.E. Wieman, and E.A. Cornell, Phys. Rev. Lett. 83, 2498 (1999). PRLTAO 0031-9007 10.1103/PhysRevLett.83.2498
10. S. Burger, K. Bongs, S. Dettmer, W. Ertmer, and K. Sengstock, Phys. Rev. Lett. 83, 5198 (1999). PRLTAO 0031-9007 10.1103/PhysRevLett.83.5198
11. C. Henkel, J.-Y. Courtois, and A. Aspect, J. Phys. II (France) JPAHER 1155-4312 4, 1955 (1994), and references therein. 10.1051/jp2:1994242
12. P. Rosenbusch, B.V. Hall, I.G. Hughes, C.V. Saba, and E.A. Hinds, Appl. Phys. B APBOEM 0946-2171 70, 709 (2000). 10.1007/s003400050885
13. A. GÃ, M. Kemmler, S. Kraft, C.J. Vale, C. Zimmermann, and J. FortÃgh, Phys. Rev. A 71, 063619 (2005). PLRAAN 1050-2947 10.1103/PhysRevA.71.063619
14. G.I. Opat, S.J. Wark, and A. Cimmino, Appl. Phys. B APPCDL 0721-7269 54, 396 (1992). 10.1007/BF00325385
15. D. Lau, R. McLean, A. Sidorov, D. Gough, J. Koperski, W. Rowlands, B. Sexton, G. Opat, and P. Hannaford, J. Opt. B 1, 371 (1999). JOBOFD 1464-4266 10.1088/1464-4266/1/4/303
16. J. FortÃgh, H. Ott, S. Kraft, A. GÃnther, and C. Zimmermann, Appl. Phys. B APBOEM 0946-2171 76, 157 (2003). 10.1007/s00340-003-1107-9
17. S. Kraft, A. GÃnther, H. Ott, D. Wharam, C. Zimmermann, and J. FortÃgh, J. Phys. B JPAPEH 0953-4075 35, L469 (2002). 10.1088/0953-4075/ 35/21/102
18. Y. Castin and R. Dum, Phys. Rev. Lett. 77, 5315 (1996). PRLTAO 0031-9007 10.1103/PhysRevLett.77.5315