Improving final test throughput via RFID tracking of probe cards

IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings

Volumn , Issue , 2005, Pages 80-83

  Ingamells, Mike ^a,c,d   Kober, Jens ^b,e  

^a Asyst Technologies Inc   (United States)

^b ADVANCED MICRO DEVICES   (United States)

^c Asyst's STS/Auto ID Division   (United States)

^d Asyst Technologies   (United States)

^e AMD ^*

Author keywords

[No Author keywords available]

Indexed keywords

INDUSTRIAL MANAGEMENT; PRODUCTION CONTROL; THROUGHPUT;

PROBE CARDS; RADIO FREQUENCY IDENTIFICATION (RFID); WAFER TEST;

SILICON WAFERS;

EID: 28744455480     PISSN: 1523553X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/issm.2005.1513301     Document Type: Conference Paper

References (0)