Impact of substrate bias on p-MOSFET negative bias temperature instability

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2005, Pages 700-701

  Kumar, P Bharath ^a   Dalei, T R ^a   Varghese, D ^a   Saha, D ^a   Mahapatra, S ^a   Alam, M A ^b  

^a INDIAN INSTITUTE OF TECHNOLOGY BOMBAY   (India)

^b PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 28744451086     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)

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