Charge dynamics and Kondo effect in single-electron traps in field-effect transistors

Physical Review B - Condensed Matter and Materials Physics

Volumn 71, Issue 16, 2005, Pages

  Martin, I ^a   Mozyrsky, D ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 28644434304     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.71.165115     Document Type: Article

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