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Volumn 71, Issue 17, 2005, Pages

Experimental evidence of the dominant role of low-angle grain boundaries for the critical current density in epitaxially grown Y Ba2 Cu3 O7-δ thin films

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EID: 28644431799     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.71.174508     Document Type: Article
Times cited : (15)

References (18)
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    • PRBMDO 0163-1829 10.1103/PhysRevB.68.054508
    • J. Albrecht, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.68.054508 68, 054508 (2003).
    • (2003) Phys. Rev. B , vol.68 , pp. 054508
    • Albrecht, J.1
  • 17
    • 0001356979 scopus 로고    scopus 로고
    • RMPHAT 0034-6861 10.1103/RevModPhys.74.485
    • H. Hilgenkamp and J. Mannhart, Rev. Mod. Phys. RMPHAT 0034-6861 10.1103/RevModPhys.74.485 74, 485 (2002).
    • (2002) Rev. Mod. Phys. , vol.74 , pp. 485
    • Hilgenkamp, H.1    Mannhart, J.2
  • 18
    • 0000487238 scopus 로고    scopus 로고
    • PRBMDO 0163-1829 10.1103/PhysRevB.57.13878
    • A. Gurevich and E. A. Pashitskii, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.57.13878 57, 13878 (1998).
    • (1998) Phys. Rev. B , vol.57 , pp. 13878
    • Gurevich, A.1    Pashitskii, E.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.