On the accuracy of scattering measurements in free space: Random and systematic errors

ANTEM 2005 - 11th International Symposium on Antenna Technology and Applied Electromagnetics, Conference Proceedings

Volumn , Issue , 2005, Pages

  Eyraud, Christelle ^a   Geffrin, Jean Michel ^a   Sabouroux, Pierre ^a  

^a AIX MARSEILLE UNIVERSITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

RANDOM ERRORS;

FREE SPACES; MEASUREMENT ACCURACY; SCATTERING MEASUREMENTS;

SYSTEMATIC ERRORS;

EID: 28544451508     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ANTEM.2005.7852069     Document Type: Conference Paper

References (8)

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