Nanorefractometer based on deposition of an overlay on a Long Period Fiber Grating

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5855 PART II, Issue , 2005, Pages 840-843

  Del Villar, Ignacio ^a   Matías, Ignacio R ^a   Arregui, Francisco J ^a  

^a PUBLIC UNIVERSITY OF NAVARRE   (Spain)

Author keywords

Coupled mode analysis; Electrostatic self assembly; Nanosensors; Refractometer

Indexed keywords

NUMERICAL METHODS; REFLECTOMETERS; REFRACTIVE INDEX; SENSITIVITY ANALYSIS;

COUPLED MODE ANALYSIS; ELECTROSTATIC SELF-ASSEMBLY; NANOSENSORS;

FIBER BRAGG GRATINGS;

EID: 28544444162     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.624262     Document Type: Conference Paper

References (13)

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