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Volumn 5853 PART II, Issue , 2005, Pages 1031-1042

Gray scaling in high performance mask making

Author keywords

Address resolution; Gray scaling; Partial coherence; SLM

Indexed keywords

COHERENT LIGHT; IMAGE PROCESSING; IMAGE QUALITY; OPTICAL RESOLVING POWER; PHOTOLITHOGRAPHY; SEMICONDUCTOR DEVICE MANUFACTURE; THROUGHPUT;

EID: 28544440983     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.617527     Document Type: Conference Paper
Times cited : (6)

References (16)
  • 1
    • 0035765981 scopus 로고    scopus 로고
    • Impact of graybeam method of virtual address reduction on image quality
    • C. Mack, "Impact of graybeam method of virtual address reduction on image quality", Proc. SPIE Int. Soc. Opt. Eng., 4562, 537-544, (2002)
    • (2002) Proc. SPIE Int. Soc. Opt. Eng. , vol.4562 , pp. 537-544
    • Mack, C.1
  • 2
    • 0036411475 scopus 로고    scopus 로고
    • Theoretical analysis of the potential for maskless lithography
    • C. Mack, "Theoretical analysis of the potential for maskless lithography", Proc. SPIE Int. Soc. Opt. Eng., 4691, 98-106, (2002)
    • (2002) Proc. SPIE Int. Soc. Opt. Eng. , vol.4691 , pp. 98-106
    • Mack, C.1
  • 3
    • 0034825560 scopus 로고    scopus 로고
    • Using the normalized image log-slope
    • February
    • C. Mack, "Using the normalized image log-slope", Microlithography World, 23-24, (February 2001)
    • (2001) Microlithography World , pp. 23-24
    • Mack, C.1
  • 4
    • 0036564685 scopus 로고    scopus 로고
    • Using the normalized image log-slope, part 2
    • May
    • C. Mack, "Using the normalized image log-slope, part 2", Microlithography World, 20-22, (May 2001)
    • (2001) Microlithography World , pp. 20-22
    • Mack, C.1
  • 8
    • 0037966004 scopus 로고    scopus 로고
    • Resolution extensions in the Sigma7000 imaging pattern generator
    • T. Sandstrom and N. Eriksson, "Resolution extensions in the Sigma7000 imaging pattern generator", Proc. SPIE Int. Soc. Opt. Eng., 4889, 157-166, (2002)
    • (2002) Proc. SPIE Int. Soc. Opt. Eng. , vol.4889 , pp. 157-166
    • Sandstrom, T.1    Eriksson, N.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.