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Volumn 242, Issue 1-2, 2006, Pages 448-451

Ion-beam implantation and cross-sectional TEM characterization of Gd 2Ti2O7 pyrochlore

Author keywords

Critical amorphization dose; Cross sectional TEM; Ion implantation; Pyrochlore

Indexed keywords

AMORPHIZATION; COMPOSITION; ION BEAMS; ION IMPLANTATION; MICROSTRUCTURE; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 28544432196     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.08.060     Document Type: Conference Paper
Times cited : (15)

References (23)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.