Application of electrical resistance tomography to two-phase flow and void fraction measurement

3rd World Congress on Industrial Process Tomography

Volumn , Issue , 2003, Pages 299-304

  Dong, F ^a   Qiao, X T ^a   Jiang, Z X ^a   Xu, L A ^a  

^a TIANJIN UNIVERSITY   (China)

Author keywords

Electrical resistance tomography; Two phase flow; Void fraction

Indexed keywords

ELECTRIC RESISTANCE; TOMOGRAPHY; VOID FRACTION;

ELECTRICAL RESISTANCE TOMOGRAPHY; PHASE DISTRIBUTION; POLYNOMIAL REGRESSION; SIMULATION CALCULATION; TIANJIN; VOID FRACTION MEASUREMENT;

TWO PHASE FLOW;

EID: 28444495689     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)

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