Vibration analysis of gyro sensors by using ESPI technique

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5852 PART I, Issue , 2005, Pages 220-222

  Ham, Seon Il ^a   Lee, Jae Huk ^a   Park, Sang Duck ^a  

^a SAMSUNG Electronics   (South Korea)

Author keywords

ESPI(Electronic speckle pattern interferometry); LDV(Laser doppler vibrometer); Micro gyroscope sensor

Indexed keywords

INTERFEROMETRY; NATURAL FREQUENCIES; SENSORS; SPECKLE; VIBRATION MEASUREMENT;

ESPI (ELECTRONIC SPECKLE PATTERN INTERFEROMETRY); LDV (LASER DOPPLER VIBROMETER); MICRO GYROSCOPE SENSOR;

GYROSCOPES;

EID: 28444477002     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.621488     Document Type: Conference Paper

References (4)

1. Dave. S. Steinberg, Vibration Analysis for Electronic Equipment, John Willey & Sons, 2000
2. Dave. S. Steinberg, Preventing Thermal Cycling and Vibration Failures in Electronic Equipment, John Willey & Sons, 2001
3. Jones. R., and Wykes. C., Holographic and speckle interferometry, Univ. Press, Cambridge, 1989
4. Vest CM. Holographic interferometry. New York: Wiley, 1979