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Volumn 30, Issue 2, 2005, Pages 7-15

Thermal annealing effects on vanadium pentoxide xerogel films

Author keywords

Conductivity; Electrochemistry; Vanadium pentoxide xerogel; X ray diffraction

Indexed keywords


EID: 28444473777     PISSN: 01004670     EISSN: 01004670     Source Type: Journal    
DOI: 10.1590/S0100-46702005000200001     Document Type: Article
Times cited : (10)

References (34)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.