A novel pulse echo correlation tool for transmission path testing and fault finding using pseudorandom binary sequences

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 2005, Pages 229-237

  Horan, David M ^a,b   Guinee, Richard A ^a,b  

^a IEEE   (Ireland)

^b Munster Technological University   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

LUMPED PARAMETER DISTRIBUTION; PULSE ECHO CORRELATION TOOL; TRANSMISSION PATH TESTING; TROUBLE-SHOOTING;

BINARY SEQUENCES; CONDITION MONITORING; FAULT TOLERANT COMPUTER SYSTEMS; INTEGRATED CIRCUITS; MOTION PLANNING; PRINTED CIRCUIT BOARDS; REFLECTOMETERS; TIME DOMAIN ANALYSIS;

TESTING;

EID: 28444470822     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)

1. F. R. Conner, Waves, Arnold publishers, Great Britain, 1972.
2. F. R. Conner, Signals, Arnold publishers, Great Britain, 1972.
3. M.G.Hartley, Digital Simulation Method, Peter Peregrinus Ltd., England, 1975.
4. W. Fraser, Telecommunications, Macdonald and Jane's Publishers, London, 1978.
5. B.R. Wilkins, Testing Digital Circuits, Van Nostrand Reinhold, 1986.
6. D. Green, Modern Logic Design, Addison-Wesley, England, 1986.
7. L. Ljung, System identification: Theory For The User, PHI, 1987.
8. K. Zeng, C. H. Yang, and D. Y. Wei, "Pseudorandom Bit Generators in Stream-Cipher Cryptography", Computer, vol.24, issue 2, February 1991, pp.8-17.
9. J. Schwartzenbach and K.F. Gill, System Modelling and Control, Arnold Publishers, London, 1992
10. K. Godfrey, Perturbation Signals for System Identification, PHI, New York, 1993.
11. B. Clegg, Underground Cable Fault Location, McGraw Hill, England, 1993.
12. A. Vladimirescu, The Spice Book, J.Wiley, NY, 1994.
13. A. Grochowski, D. Bhattacharya, T.R. Viswanathan and K. Laker, "Integrated Circuit Testing for Quality Assurance in Manufacture: History, Current Status and Future Trends", IEEE Transactions on Circuits and Systems - II: Analog and Digital Signal Processing, Vol.44, No.8, AUG. 1997.
14. MicoSim pSpice, Circuit Analysis Software, Ver.8.0, June 1997, MicroSim Corp.
15. Oliphant, M.W., "The Mobile Phone Meets The Internet", IEEE Spectrum, Aug 1999.
16. R.A. Guinee, "Digital Circuit Testing with Signature Analysis Employing Pseudorandom Binary Sequence (PRBS) Generators", IASTED International Conference Applied Modelling and Simulation, Australia, 1999.
17. th Mediterranean Electrotechnical Conference, May, 2000, Cyprus.
18. Printed Circuit Test (PCB) Methodology User Guide, Rev. 1.6, Jan 2000, Intel Corp. www.intel.com/design/chipsets/applnots/29817901.pdf
19. Time Domain Reflectometry Theory, Application Note 1304-2 for use with Agilient 86100B Infiniium DCA, Agilient Technologies, Aug. 2002, www.agilient.com.
20. Distance Simulation using Pseudo Random Binary Sequences, Project Report by D. Horan, Electronic Engineering Dept., Cork Institute of Technology, May 2004.