Software-based self-test for pipelined processors: A case study

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 2005, Pages 535-543

  Hatzimihail, M ^a   Psarakis, M ^a   Xenoulis, G ^a   Gizopoulos, D ^a   Paschalis, A ^b  

^a UNIVERSITY OF PIRAEUS   (Greece)

^b UNIVERSITY OF ATHENS   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER HARDWARE; DATA HANDLING; FAULT TOLERANT COMPUTER SYSTEMS; MATHEMATICAL MODELS; PROGRAM PROCESSORS;

DATA FORWARDING; FAULT COVERAGE; PROCESSOR BASED SYSTEMS; SOFTWARE-BASED SELF-TEST (SBST);

BUILT-IN SELF TEST;

EID: 28444468786     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)

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