Static buckling and actuation of free-standing mesoscale beams

IEEE Transactions on Nanotechnology

Volumn 4, Issue 6, 2005, Pages 655-659

  Carr, Stephen M ^b   Lawrence, Walter E ^e   Wybourne, Martin N ^a,c,d,e  

^a IEEE   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c DARTMOUTH COLLEGE   (United States)

^d Institute of Physics   (United States)

^e Dartmouth College   (United States)

Author keywords

Buckling; Electromechanical effects; Mesoscopic physics; Microelectromechanical devices; Nanoelectromechanical systems (NEMS); Strain

Indexed keywords

ELECTROMECHANICAL EFFECTS; MESOSCOPIC PHYSICS; NANOELECTROMECHANICAL SYSTEMS (NEMS);

MICROACTUATORS; MICROELECTROMECHANICAL DEVICES; NANOTECHNOLOGY;

BUCKLING;

EID: 28444458561     PISSN: 1536125X     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNANO.2005.858605     Document Type: Article

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