Standby and active leakage current control and minimization in CMOS VLSI circuits

IEICE Transactions on Electronics

Volumn E88-C, Issue 4, 2005, Pages 509-519

  Fallah, Farzan ^a,c   Pedram, Massoud ^b,c,d  

^a FUJITSU LABORATORIES OF AMERICA   (United States)

^b University of Southern California ^*  (United States)

^c IEEE

^d ACM Interest Group on Design Automation

Author keywords

Leakage; Power; Sleep mode; Standby; Subthreshold

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC POTENTIAL; LEAKAGE CURRENTS; SWITCHING; TRANSISTORS; VLSI CIRCUITS;

LEAKAGE; POWER; SLEEP MODE; STANDBY; SUBTHRESHOLD;

ELECTRIC CURRENT CONTROL;

EID: 28444449755     PISSN: 09168524     EISSN: 17451353     Source Type: Journal    
DOI: 10.1093/ietele/e88-c.4.509     Document Type: Article

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