High resonant mass sensor evaluation: An effective method

Review of Scientific Instruments

Volumn 76, Issue 11, 2005, Pages 1-6

  Tseytlin, Yakov M ^a  

^a SOCIETY OF MANUFACTURING ENGINEERS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED CALCULATION; MASS SENSORS; NODAL POINTS; RESONANT OSCILLATIONS;

ALGORITHMS; ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; NANOSTRUCTURED MATERIALS; OSCILLATIONS; SENSITIVITY ANALYSIS;

SENSORS;

EID: 28444444924     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2115207     Document Type: Review

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