High accuracy measurement of low-frequency noise in front-end P-channel FETs

Nuclear Physics B (Proceedings Supplements)

Volumn 44, Issue 1-3, 1995, Pages 607-612

  Re, V ^a   Svelto, F ^a  

^a UNIVERSITY OF PAVIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 28444433579     PISSN: 09205632     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0920-5632(95)80093-X     Document Type: Article

References (5)

1. Extremely Low-Noise Amplifier for Interfacing Active Devices to Instruments for Spectral Analysis
2. Representation of Noise in Linear Two-ports — IRE Subcommittee 7.9 on Noise
3. DMILL, a Mixed Analog-Digital Radiation Hard Technology for High Energy Physics Electronics
4. JFET-CMOS Microstrip Front-End
5. Distributed Substrate Resistance Noise in Fine-Line NMOS Field-Effect Transistors