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Journal of Colloid and Interface Science

Volumn 295, Issue 1, 2006, Pages 294-298

A simple FTIR technique for estimating the surface area of silica powders and films

(3) McCool, Ben a Murphy, Lawrence b Tripp, Carl P a,c

a UNIVERSITY OF MAINE (United States)

b CABOT CORPORATION (United States)

c University of Maine (United States)

Author keywords

Infrared spectroscopy; Silica; Surface area

Indexed keywords

ADSORPTION; FOURIER TRANSFORM INFRARED SPECTROSCOPY;

SILICA FILMS; SILICA POWDERS; SURFACE AREA;

SILICA;

SILICON DIOXIDE;

ACCURACY; ADSORPTION; ANALYTIC METHOD; ARTICLE; CALIBRATION; FILM; INFRARED SPECTROSCOPY; POROSITY; POWDER; PRIORITY JOURNAL; SURFACE PROPERTY;

EID: 28444432715 PISSN: 00219797 EISSN: None Source Type: Journal
DOI: 10.1016/j.jcis.2005.08.010 Document Type: Article

Times cited : (41)

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