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Volumn 41, Issue 13, 1996, Pages 1079-1083

A new way of fabricating luminescent silicon crystallites by excimer laser annealing of a-Si: H

Author keywords

Crystallization; Excimer laser; Nano size Si

Indexed keywords


EID: 2842563935     PISSN: 10016538     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (1)

References (6)
  • 1
    • 0141775174 scopus 로고
    • Silicon quantum wire array fabrication by electrochemical and chemical dissolution of wafers
    • Canham, L. T., Silicon quantum wire array fabrication by electrochemical and chemical dissolution of wafers, Appl. Phys. Lett., 1990, 57: 1046.
    • (1990) Appl. Phys. Lett. , vol.57 , pp. 1046
    • Canham, L.T.1
  • 2
    • 36449001314 scopus 로고
    • Visible photoluminescence in crystallized amorphous Si: H/SiNx: H multiquantum-well structures
    • Chen, K. J., Huang, X. F., Xu, J. et al., Visible photoluminescence in crystallized amorphous Si: H/SiNx: H multiquantum-well structures, Appl. Phys. Lett., 1992, 61: 2069.
    • (1992) Appl. Phys. Lett. , vol.61 , pp. 2069
    • Chen, K.J.1    Huang, X.F.2    Xu, J.3
  • 3
    • 0018470344 scopus 로고
    • Hydrogen content and density of plasma-deposited amorphous silicon-hydrogen
    • Fritzsche, H., Hydrogen content and density of plasma-deposited amorphous silicon-hydrogen, J. Appl. Phys., 1979, 50: 3366.
    • (1979) J. Appl. Phys. , vol.50 , pp. 3366
    • Fritzsche, H.1
  • 4
    • 0027540055 scopus 로고
    • Excimer-laser-annealed poly-Si thin-film-transistors
    • Brotherton, S. D., Excimer-laser-annealed poly-Si thin-film-transistors, IEEE, Trans. on ED, 1993, 40: 407.
    • (1993) IEEE, Trans. on ED , vol.40 , pp. 407
    • Brotherton, S.D.1
  • 5
    • 0025402689 scopus 로고
    • Raman measurement of grain size for the crystallite silicon
    • Cheng, G. X., Xia, H., Chen, K. J., Raman measurement of grain size for the crystallite silicon, Phys. Stat. Sol., 1990, 118: k51.
    • (1990) Phys. Stat. Sol. , vol.118
    • Cheng, G.X.1    Xia, H.2    Chen, K.J.3
  • 6
    • 36449004108 scopus 로고
    • Phase transformation mechanisms involved in excimer laser crystallization of amorphous silicon films
    • James, S., Kim, H. J., Phase transformation mechanisms involved in excimer laser crystallization of amorphous silicon films, Appl. Phys. Lett., 1993, 63: 1969.
    • (1993) Appl. Phys. Lett. , vol.63 , pp. 1969
    • James, S.1    Kim, H.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.