Direct observation of the c(8×8) defect structure on Si(001) using scanning tunneling microscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 54, Issue 19, 1996, Pages 13468-13471

  Murray, P ^a   Lindsay, R ^a   Leibsle, F ^b  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b UNIVERSITY OF LIVERPOOL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 2842538028     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.54.13468     Document Type: Article

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