Measurement of the magnetoelectric coefficient using a scanning evanescent microwave microscope

Applied Physics Letters

Volumn 87, Issue 15, 2005, Pages 1-3

  Gao, Chen ^a   Hu, Bo ^b   Li, Xuefei ^b   Liu, Chihui ^b   Murakami, M ^c   Chang, K S ^c   Long, C J ^c   Wuttig, M ^c   Takeuchi, I ^c,d  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^c UNIVERSITY OF MARYLAND   (United States)

^d Bldg 142   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MAGNETOELECTRIC COEFFICIENT; MICROWAVE MICROSCOPES;

MICROWAVE DEVICES; PERMITTIVITY;

MAGNETOELECTRIC EFFECTS;

EID: 28344453492     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2093925     Document Type: Article

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