Reaction microscope study of near-threshold photo double ionization of xenon using high harmonics

Journal of Physics B: Atomic, Molecular and Optical Physics

Volumn 38, Issue 23, 2005, Pages

  Bottcher M ^a   Rottke, H ^a   Zhavoronkov, N ^a   Sandner, W ^a   Agostini, P ^b,c   Gisselbrecht, M ^b   Huetz, A ^b  

^a MAX BORN INSTITUT   (Germany)

^b INSTITUT DES SCIENCES MOLÉCULAIRES D ORSAY   (France)

^c OHIO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; MICROSCOPES; PARAMETER ESTIMATION; PHOTOIONIZATION; REACTION KINETICS;

ELECTRON MOMENTUM; ENERGY DISTRIBUTIONS; HIGH HARMONICS; MOMENTUM CORRELATION;

XENON;

EID: 28344446812     PISSN: 09534075     EISSN: 13616455     Source Type: Journal    
DOI: 10.1088/0953-4075/38/23/L04     Document Type: Article

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