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Volumn , Issue , 1998, Pages 955-956

Quality estimation of test vectors and functional validation procedures based on fault and error models

Author keywords

[No Author keywords available]

Indexed keywords

ERROR MODEL; FAULT MODEL; FUNCTIONAL VALIDATION; QUALITY ESTIMATION; TEST VECTORS;

EID: 28344439141     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.1998.655986     Document Type: Conference Paper
Times cited : (3)

References (6)
  • 1
    • 84893732710 scopus 로고    scopus 로고
    • PRENDA, ASIC Design Methodologies, edited by UPM/DIE (Spain), November 1996
    • PRENDA, ASIC Design Methodologies, edited by UPM/DIE (Spain), November 1996.
  • 3
    • 0024036029 scopus 로고
    • Formal verification of hardware correctness: Introduction and survey of current research
    • July
    • P. Camurati, P. Prinetto, "Formal Verification of Hardware Correctness: Introduction and Survey of Current Research", IEEE Computer, pp. 8-19, July 1988.
    • (1988) IEEE Computer , pp. 8-19
    • Camurati, P.1    Prinetto, P.2
  • 4
    • 84893785791 scopus 로고
    • Ieee, ieee standard vhdl language reference manual
    • IEEE, IEEE Standard VHDL Language Reference Manual. IEEE Std 1076-1993, IEEE, 1993.
    • (1993) IEEE Std 1076-1993, IEEE
  • 5
    • 0007842957 scopus 로고    scopus 로고
    • A fault model for vhdl descriptions at the register transfer level
    • Geneva (Switzerland), September
    • T. Riesgo, J. Uceda, "A Fault Model for VHDL Descriptions at the Register Transfer Level", Proc. of EURO-DAC with EURO-VHDL'96, Geneva (Switzerland), September 1996.
    • (1996) Proc. of EURO-DAC with EURO-VHDL'96
    • Riesgo, T.1    Uceda, J.2
  • 6
    • 84893726986 scopus 로고    scopus 로고
    • Estimation of the quality of design validation experiments based on error models
    • Toledo (Spain), April
    • T. Riesgo, Y. Torroja, C. López, J. Uceda, "Estimation of the Quality of Design Validation Experiments Based on Error Models", Proc. of VHDL Users'Forum in Europe, Toledo (Spain), April 1997.
    • (1997) Proc. of VHDL Users'Forum in Europe
    • Riesgo, T.1    Torroja, Y.2    López, C.3    Uceda, J.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.