Near-field scanning optical microscopic transient lens for carrier dynamics study in InGaNGaN

Applied Physics Letters

Volumn 87, Issue 16, 2005, Pages 1-3

  Okamoto, Koichi ^a   Scherer, Axel ^a   Kawakami, Yoichi ^b  

^a California Institute of Technology   (United States)

^b KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER DYNAMICS; NEAR-FIELD SCANNING; THERMAL DYNAMICS;

CARRIER CONCENTRATION; LENSES; SEMICONDUCTOR QUANTUM WELLS;

OPTICAL MICROSCOPY;

EID: 28344433167     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2105999     Document Type: Article

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