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Volumn 483-485, Issue , 2005, Pages 581-584
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Surface and interface studies of Si-rich 4H-SiC and SiO2
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Author keywords
Angle resolved photoemission; Oxidation; Silicon carbide
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Indexed keywords
INTERFACES (MATERIALS);
OXIDATION;
SILICON CARBIDE;
SYNCHROTRON RADIATION;
VALENCE BANDS;
ANGLE RESOLVED PHOTOEMISSION;
PHOTOEMISSION STUDY;
SILICA;
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EID: 28244488335
PISSN: 02555476
EISSN: 16629752
Source Type: Book Series
DOI: 10.4028/0-87849-963-6.581 Document Type: Conference Paper |
Times cited : (1)
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References (8)
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