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Volumn 483-485, Issue , 2005, Pages 581-584

Surface and interface studies of Si-rich 4H-SiC and SiO2

Author keywords

Angle resolved photoemission; Oxidation; Silicon carbide

Indexed keywords

INTERFACES (MATERIALS); OXIDATION; SILICON CARBIDE; SYNCHROTRON RADIATION; VALENCE BANDS;

EID: 28244488335     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-963-6.581     Document Type: Conference Paper
Times cited : (1)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.