Micro-sampling, high sensitivity ETV-ICP-MS method for the determination of trace rare earth impurities in high purity lanthanum oxide

Atomic Spectroscopy

Volumn 26, Issue 5, 2005, Pages 197-202

  Yin, Jun ^a   Hu, Bin ^a   He, Man ^a   Jiang, Zucheng ^a  

^a WUHAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 28244481077     PISSN: 01955373     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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