-
1
-
-
0032337228
-
Pulsed electron beam technology for surface modification of metallic materials
-
Proskurovsky D I, Rotshtein V P, Ozur G E, et al. Pulsed electron beam technology for surface modification of metallic materials[J]. J Vac Sci Technol A, 1998, 1694: 2480-2488.
-
(1998)
J Vac Sci Technol A
, vol.1694
, pp. 2480-2488
-
-
Proskurovsky, D.I.1
Rotshtein, V.P.2
Ozur, G.E.3
-
2
-
-
0033900558
-
Physical foundations for surface treatment of materials with low energy, high current electron beams
-
Proskurovsky D I, Rotshtein V P, Ozur G E, et al. Physical foundations for surface treatment of materials with low energy, high current electron beams[J]. Surface and Coatings Technology, 2000, 125: 49-56.
-
(2000)
Surface and Coatings Technology
, vol.125
, pp. 49-56
-
-
Proskurovsky, D.I.1
Rotshtein, V.P.2
Ozur, G.E.3
-
3
-
-
0033573394
-
Effect of 'duplex' treatment on changes of physical and mechanical properties of steel (0.3wt% C)
-
Pogrebnjak A D, Shumakova N I. Effect of 'duplex' treatment on changes of physical and mechanical properties of steel (0.3wt% C)[J]. Surface and Coating Technology, 1999, 122: 183-187.
-
(1999)
Surface and Coating Technology
, vol.122
, pp. 183-187
-
-
Pogrebnjak, A.D.1
Shumakova, N.I.2
-
4
-
-
0032208745
-
A review of mixing process in Ta/Fe and Mo/Fe systems treated by high current electron beams
-
Pogrebnjak A D, Bratushka S, Boyko V I, et al. A review of mixing process in Ta/Fe and Mo/Fe systems treated by high current electron beams[J]. Nucl Instr and Meth in Phys Res B, 1998, 145: 373-390.
-
(1998)
Nucl Instr and Meth in Phys Res B
, vol.145
, pp. 373-390
-
-
Pogrebnjak, A.D.1
Bratushka, S.2
Boyko, V.I.3
-
5
-
-
0042919215
-
Surface treatment of aluminum by high current pulsed electron beam
-
Hao S Z, Yao S, Guan J, et al. Surface treatment of aluminum by high current pulsed electron beam[J]. Current Applied Physics, 2001, 1(2-3): 203-208.
-
(2001)
Current Applied Physics
, vol.1
, Issue.2-3
, pp. 203-208
-
-
Hao, S.Z.1
Yao, S.2
Guan, J.3
-
6
-
-
28244474260
-
-
Chinese source
-
-
-
-
7
-
-
0037472528
-
Surface treatment by high current pulsed electron beam
-
Dong C, Wu A M, Hao S Z, et al. Surface treatment by high current pulsed electron beam[J]. Surface and Coatings Technology, 2003, 163-164: 620-624.
-
(2003)
Surface and Coatings Technology
, vol.163-164
, pp. 620-624
-
-
Dong, C.1
Wu, A.M.2
Hao, S.Z.3
-
8
-
-
2442439945
-
Oxidation protection of AISI H13 steel by high current pulsed electron beam treatment
-
Zou J X, Wu A M, Dong C, et al. Oxidation protection of AISI H13 steel by high current pulsed electron beam treatment[J]. Surface and Coatings Technology, 2004, 184: 261-267.
-
(2004)
Surface and Coatings Technology
, vol.184
, pp. 261-267
-
-
Zou, J.X.1
Wu, A.M.2
Dong, C.3
-
9
-
-
0842311741
-
Temperature profile and crater formation induced in high current pulsed electron beam processing
-
Qin Y, Dong C, Wang X G, et al. Temperature profile and crater formation induced in high current pulsed electron beam processing[J]. J of Vac Sci and Tech A, 2003, 21(6): 1934-1938.
-
(2003)
J of Vac Sci and Tech A
, vol.21
, Issue.6
, pp. 1934-1938
-
-
Qin, Y.1
Dong, C.2
Wang, X.G.3
-
10
-
-
28244447814
-
-
Chinese source
-
-
-
-
11
-
-
28244448799
-
-
Chinese source
-
-
-
-
12
-
-
28244446426
-
-
Chinese source
-
-
-
-
13
-
-
3142510941
-
Numerical simulation of the thermal-mechanical process of high current pulsed electron beam (HCPEB) treatment
-
Zou J X, Qin Y, Dong C, et al. Numerical simulation of the thermal-mechanical process of high current pulsed electron beam (HCPEB) treatment[J]. J of Vac Sci and Tech A, 5/6, 2004, 22(3): 545-552.
-
(2004)
J of Vac Sci and Tech A, 5/6
, vol.22
, Issue.3
, pp. 545-552
-
-
Zou, J.X.1
Qin, Y.2
Dong, C.3
-
14
-
-
4544314424
-
Temperature-stress fields and related phenomena induced by a high current pulsed electron beam
-
Qin Y, Zou J X, Dong C, et al. Temperature-stress fields and related phenomena induced by a high current pulsed electron beam[J]. Nucl Instr and Meth in Phys Res B, 2004, 255: 544-554.
-
(2004)
Nucl Instr and Meth in Phys Res B
, vol.255
, pp. 544-554
-
-
Qin, Y.1
Zou, J.X.2
Dong, C.3
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