SCOPUS 정보 검색 플랫폼

Surface Science

Volumn 598, Issue 1-3, 2005, Pages 88-95

Scanning tunneling microscopy study of the fivefold surface of icosahedral Al-Cu-Ru quasicrystal

(3) Shimoda, M a,b Sharma, H R a Tsai, A P a,b,c

a NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

b JAPAN SCIENCE AND TECHNOLOGY AGENCY (Japan)

c TOHOKU UNIVERSITY (Japan)

Author keywords

Quasicrystals; Reflection high energy electron diffraction; Scanning tunneling microscopy; Termination

Indexed keywords

ALUMINUM; COPPER; QUASICRYSTALS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; RUTHENIUM; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE;

ISOSTRUCTURE; STACKING SEQUENCE; TERMINATION;

SURFACE TREATMENT;

EID: 28244435463 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/j.susc.2005.08.029 Document Type: Article

Times cited : (13)

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