Temporal change threshold detection imager

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn 48, Issue , 2005, Pages 298-299

  Mallik, Udayan ^a   Clapp, Matthew ^a   Choi, Edward ^a   Cauwenberghs, Gert ^a   Etienne Cummings, Ralph ^a  

^a JOHNS HOPKINS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE PIXEL SENSORS (APS); INTENSITY REDOUT; MOTION DETECTION;

BANDWIDTH; CMOS INTEGRATED CIRCUITS; IMAGE SENSORS; POLARIMETERS; THRESHOLD ELEMENTS;

IMAGING SYSTEMS;

EID: 28144463227     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)