Bayesian single-level binomial and exponential reliability demonstration test plans

International Journal of Reliability, Quality and Safety Engineering

Volumn 6, Issue 2, 1999, Pages 123-137

  Fitzgerald, Mark ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

Bayesian test plans; Binomial testing; Exponential testing; Prior mixtures; Reliability demonstration testing; Sampling plans

Indexed keywords

EID: 28144462077     PISSN: 02185393     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218539399000139     Document Type: Article

References (2)

1. C. L. Atwood, "Constrained noninformative priors in risk assessment," Reliability Engineering and System Safety 53 (1996), pp. 37-46.
2. G. C. Brush, "A comparison of classical and Bayes producer's risk," Technometrics 28 (1986), pp. 69-72.