A fully-integrated CMOS Hall sensor with a 3.65μT, 3σ offset spread for compass applications

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn 48, Issue , 2005, Pages

  Van Der Meer, Jeroen C ^a   Riedijk, Frank R ^a   Van Kampen, Edward ^a   Makinwa, Kofi A A ^b   Huijsing, Johan H ^b  

^a Xensor Integration   (Netherlands)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; CALIBRATION; COMPASSES (MAGNETIC); HALL EFFECT; INTEGRATION; INTERFACES (MATERIALS); SENSORS;

ARTIFICIAL AGING; CALIBRATED COMPASS; DRIFTS; HALL SENSORS;

CMOS INTEGRATED CIRCUITS;

EID: 28144439473     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)