Paraelectric (Ba0.6Sr0.4)TiO3 thick films by direct-write

IEEE International Symposium on Applications of Ferroelectrics

Volumn , Issue , 2005, Pages 21-24

  Kunduraci, M ^a   Simon, W K ^a   Akdogan, E K ^a   Safari, A ^a  

^a RUTGERS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; BARIUM COMPOUNDS; DIELECTRIC PROPERTIES; MICROSTRUCTURE; POLYCRYSTALLINE MATERIALS; RESIDUAL STRESSES; X RAY ANALYSIS;

COMPRESSIVE STATE; DIRECT-WRITE TECHNIQUE; FILM THICKNESS; POLARIZATION CURVES;

THICK FILMS;

EID: 28144432114     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

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