Preparation, characterization and deposition of Langmuir-Blodgett Co, Al organic films for the catalytic applications

Thin Solid Films

Volumn 495, Issue 1-2, 2006, Pages 299-307

  Lojewska J ^a   Dynarowicz Latka P ^a   Kolodziej A ^b  

^a JAGIELLONIAN UNIVERSITY   (Poland)

^b INSTITUTE OF CHEMICAL ENGINEERING   (Poland)

Author keywords

Langmuir Blodgett technique; Raman microscopy; Structured carrier; Wash coat layer; XPS quantitative analysis

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMBUSTION; DEPOSITION; MICROSTRUCTURE; MONOLAYERS; SCANNING ELECTRON MICROSCOPY; SINTERING; X RAY PHOTOELECTRON SPECTROSCOPY;

LANGMUIR-BLODGETT FILMS; RAMAN MICROSCOPY; STRUCTURED CARRIER; WASH-COAT LAYER; XPS QUANTITATIVE ANALYSIS;

LANGMUIR BLODGETT FILMS;

EID: 28044468219     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.08.202     Document Type: Conference Paper

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