Ion beam implantation and cross-sectional TEM studies of lanthanide titanate pyrochlore single crystals

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 241, Issue 1-4, 2005, Pages 365-371

  Lian, Jie ^a   Wang, L M ^a   Ewing, R C ^a,c   Boatner, L A ^b  

^a UNIVERSITY OF MICHIGAN   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c 2534 CC Little Building ^*  (United States)

Author keywords

Critical amorphization dose; Cross sectional TEM; Ion implantation; Pyrochlore

Indexed keywords

CRITICAL AMORPHIZATION DOSE; CROSS-SECTIONAL TEM; PYROCHLORE; TITANATE PYROCHLORE;

AMORPHIZATION; COMPUTER SIMULATION; DOSIMETRY; ION BEAMS; ION IMPLANTATION; SINGLE CRYSTALS; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY;

LANTHANUM COMPOUNDS;

EID: 28044440504     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.07.043     Document Type: Conference Paper

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