Evaluation of chemical solution deposited BaxSr 1-xTiO3 thin films on LaAlO3 in tunable microwave devices

Integrated Ferroelectrics

Volumn 42, Issue , 2002, Pages 207-217

  Van Keuls, F W ^a   Mueller, C H ^a   Romanofsky, R R ^a   Warner, J D ^a   Miranda, F A ^a   Majumder, S B ^b   Jain, M ^b   Martinez, A ^b   Katiyar, R S ^b   Jiang, H ^c  

^a NASA GLENN RESEARCH CENTER   (United States)

^b UNIVERSITY OF PUERTO RICO   (Puerto Rico)

^c Corning Applied Technologies ^*  (United States)

Author keywords

CSD; Ferroelectric; Microwave; Tunable

Indexed keywords

BARIUM COMPOUNDS; FILM GROWTH; NATURAL FREQUENCIES; PHASE SHIFT; PULSED LASER DEPOSITION; SOL-GELS; X RAY DIFFRACTION;

CHEMICAL SOLUTION; CHEMICAL SOLUTION DEPOSITION (CSD); COUPLED MICROSTRIP PHASE SHIFTERS (CMPS); METAL-ORGANIC CHEMICAL LIQUID DEPOSITION (MOCLD);

MICROWAVE DEVICES;

EID: 28044439963     PISSN: 10584587     EISSN: 16078489     Source Type: Conference Proceeding    
DOI: 10.1080/10584580210851     Document Type: Article

References (10)

1. J.B.L. Rao, D.P. Patel, and L. Sengupta, Integrated Ferroelectrics, 22, 827 (1998).
2. E.G. Erker, A.S. Nagra, Y. Liu, P. Periaswamy, T.R. Taylor, J. Speck and R.A. York, IEEE Micr. And Guid. Wave Lett. 10, 10 (2000).
3. H.-D. Wu, Z. Zhang, F. Barnes, C.M. Jackson, A. Kain, and J.D. Cuchiaro, IEEE Trans. on Appl. Supercond., 4, 156 (1994).
4. F.W. Van Keuls, R.R. Romanofsky, C.H. Mueller, J.D. Warner, C.L. Canedy, R. Ramesh, and F.A. Miranda, Integrated Ferroelectrics 34, 1605 (2001).
5. A. Kozyrev, A. Ivanov, A. Prudan, O. Soldatenkov, E. Hollman, V. Loginov, D. Ginley, and T. Rivkin, Integrated Ferroelectrics, 24, 287 (1999).
6. S.B. Majumdar, M. Jain, A. Martinez, R.S. Katiyar, F.W. Van Keuls and F.A. Miranda, J. of Appl. Phys., 70, 896 (2001).
7. M. Jain, S.B. Majumdar, A. Martinez, R.S. Katiyar, F.W. Van Keuls, and F.A. Miranda, Integrated Ferroelectrics, (this issue).
8. F.W. Van Keuls, R.R. Romanofsky, and F.A. Miranda, Integrated Ferroelectrics, vol. 22, no. 1-4, pp. 893-901, 1998.
9. F.W. Van Keuls, R.R. Romanofsky, D.Y. Bohman, M.D. Winters, F.A. Miranda, C. H. Mueller, R. E. Treece, T.V. Rivkin and D. Galt, Appl. Phys. Lett., vol. 71, 3075, (1997).
10. D.K. Bowen and B.K. Tanner, High Resolution X-ray Diffractometry and Topography (Taylor and France, London, 1998).