SCOPUS 정보 검색 플랫폼

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 241, Issue 1-4, 2005, Pages 454-458

High resolution backscattering studies of nanostructured magnetic and semiconducting materials

(10) Fonseca, A a Franco, N a Alves, E a,b Barradas, N P a,b Leitao J P c Sobolev, N A c Banhart, D F d Presting, H e Ulyanov, V V f Nikiforov, A I f

a INSTITUTO TECNOLÓGICO E NUCLEAR (Portugal)

b CENTRO DE FÍSICA NUCLEAR DA UNIVERSIDADE DE LISBOA (Portugal)

c UNIVERSITY OF AVEIRO (Portugal)

d UNIVERSITY OF ULM (Germany)

e DAIMLER AG (Germany)

f INSTITUTE OF SEMICONDUCTOR PHYSICS (Russian Federation)

Author keywords

High resolution Rutherford backscattering; Multilayers; Nanoparticles

Indexed keywords

CRYSTALLOGRAPHY; IRON COMPOUNDS; MAGNETIC MATERIALS; MATERIALS SCIENCE; MULTILAYERS; NANOSTRUCTURED MATERIALS; QUANTUM THEORY; SEMICONDUCTING SILICON; SEMICONDUCTOR MATERIALS;

CRYSTALLINE QUALITY; HIGH RESOLUTION RUTHERFORD BACKSCATTERING; NANOPARTICLES; QUANTUM STRUCTURES;

BACKSCATTERING;

EID: 28044436501 PISSN: 0168583X EISSN: None Source Type: Journal
DOI: 10.1016/j.nimb.2005.07.093 Document Type: Conference Paper

Times cited : (13)

References (12)

1
- 0029358642
- P. Schittenhelm, M. Gail, J. Brunner, J.F. Nützel, and G. Abstreiter Appl. Phys. Lett. 67 1995 1292
- (1995) Appl. Phys. Lett. , vol.67 , pp. 1292
- Schittenhelm, P.¹ Gail, M.² Brunner, J.³ Nützel, J.F.⁴ Abstreiter, G.⁵

2
- 2642521291
- O.G. Schmidt, C. Large, E. Eberl, O. Kienzle, and F. Ernst Appl. Phys. Lett. 71 1997 2340
- (1997) Appl. Phys. Lett. , vol.71 , pp. 2340
- Schmidt, O.G.¹ Large, C.² Eberl, E.³ Kienzle, O.⁴ Ernst, F.⁵

3
- 0001039972
- A.A. Shklyaev, M. Shibata, and M. Ichikawa Phys. Rev. B 62 2000 1540
- (2000) Phys. Rev. B , vol.62 , pp. 1540
- Shklyaev, A.A.¹ Shibata, M.² Ichikawa, M.³

4
- 0037094581
- M.L. Yan, H. Zeng, N. Powers, and D.J. Sellmyer J. Appl. Phys. 91 2002 8471
- (2002) J. Appl. Phys. , vol.91 , pp. 8471
- Yan, M.L.¹ Zeng, H.² Powers, N.³ Sellmyer, D.J.⁴

5
- 0034225273
- M. Miura, J.M. Hartmann, J. Zhang, B. Joyce, and Y. Shiraki Thin Solid Films 369 2000 104
- (2000) Thin Solid Films , vol.369 , pp. 104
- Miura, M.¹ Hartmann, J.M.² Zhang, J.³ Joyce, B.⁴ Shiraki, Y.⁵

6
- 0035938304
- A.V. Kolobov, A.A. Shklyaev, H. Oyanagi, P. Fons, S. Yamasaki, and M. Ichikawa Appl. Phys. Lett. 78 2001 2563
- (2001) Appl. Phys. Lett. , vol.78 , pp. 2563
- Kolobov, A.V.¹ Shklyaev, A.A.² Oyanagi, H.³ Fons, P.⁴ Yamasaki, S.⁵ Ichikawa, M.⁶

7
- 2542427617
- M. Derivaz, P. Noé, R. Dianoux, A. Barski, A. Coati, Y. Garreau, and A. Alandi Appl. Phys. Lett. 84 2004 3295
- (2004) Appl. Phys. Lett. , vol.84 , pp. 3295
- Derivaz, M.¹ Noé, P.² Dianoux, R.³ Barski, A.⁴ Coati, A.⁵ Garreau, Y.⁶ Alandi, A.⁷

8
- 0000150769
- M. Watanabe, T. Masumoto, D.H. Ping, and K. Hono Appl. Phys. Lett. 76 2000 3971
- (2000) Appl. Phys. Lett. , vol.76 , pp. 3971
- Watanabe, M.¹ Masumoto, T.² Ping, D.H.³ Hono, K.⁴

9
- 0002679588
- N.P. Barradas, C. Jeynes, and R. Webb Appl. Phys. Lett. 71 1997 291
- (1997) Appl. Phys. Lett. , vol.71 , pp. 291
- Barradas, N.P.¹ Jeynes, C.² Webb, R.³

10
- 0041641136
- J.P. Stoquert, and T. Szörényi Phys. Rev. B 66 2002 144108
- (2002) Phys. Rev. B , vol.66 , pp. 144108
- Stoquert, J.P.¹ Szörényi, T.²

11
- 11144354261
- N.P. Barradas, E. Alves, S. Pereira, V.V. Shvartsman, A.L. Kholkin, E. Pereira, K.P. O'Donnell, C. Liu, C.J. Deatcher, I.M. Watson, and M. Mayer Nucl. Instr. and Meth. B 217 2004 479
- (2004) Nucl. Instr. and Meth. B , vol.217 , pp. 479
- Barradas, N.P.¹ Alves, E.² Pereira, S.³ Shvartsman, V.V.⁴ Kholkin, A.L.⁵ Pereira, E.⁶ O'Donnell, K.P.⁷ Liu, C.⁸ Deatcher, C.J.⁹ Watson, I.M.¹⁰ Mayer, M.¹¹

12
- 2442446996
- N.P. Barradas, E. Alves, and D. Babonneau Nucl. Instr. and Meth. B 219-220 2004 919
- (2004) Nucl. Instr. and Meth. B , vol.219-220 , pp. 919
- Barradas, N.P.¹ Alves, E.² Babonneau, D.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.