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Volumn 257, Issue 1, 2006, Pages 16-26

Experimental intensity patterns obtained from a 2D shearing interferometer with adaptable sensitivity

Author keywords

Optical design; Optical instruments; Optical testing; Shearing Interferometers

Indexed keywords

OPTICAL DESIGN; OPTICAL TESTING; OPTIMIZATION; PARAMETER ESTIMATION; SENSITIVITY ANALYSIS; WAVEFRONTS;

EID: 28044434846     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2005.07.014     Document Type: Article
Times cited : (15)

References (27)
  • 9
    • 28044437592 scopus 로고
    • E. Wolf Amsterdam North Holland
    • J. Schwider E. Wolf Progress in Optics vol. 28 1990 Amsterdam North Holland (Chapter IV)
    • (1990) Progress in Optics , vol.28
    • Schwider, J.1
  • 23
    • 28044452724 scopus 로고
    • Methods and apparatus for phase evaluation of pattern images used in optical measurement, U.S. Patent 5,361,312
    • M. Küchel, Methods and apparatus for phase evaluation of pattern images used in optical measurement, U.S. Patent 5,361,312, 1994.
    • (1994)
    • Küchel, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.